METHOD AND DEVICE FOR THE DETERMINATION OF A MEASU

专利名称：METHOD AND DEVICE FOR THE

DETERMINATION OF A MEASURE OF BANDGAPS AT OPTOELECTRONIC COMPONENTS

发明人：BOKALIC, Matevz,TOPIC, Marko,PIETERS,

Bart Elger,GERBER, Andreas,RAU, Uwe

申请号：EP16819487.6申请日：20161214公开号：EP3394979B1公开日：20190918

摘要：The invention concerns a method for a control of the quality (lateral band gapand stoichiometric varication) of an optoelectronic component, in particular a CIGS solarmodule or CIGS solar cell, with the following steps: - a voltage V higher thanzero (orcurrent or lightening) is applied on a CIGS solar cell (or a CIGS solar module or any circuitconfiguration of CIGS solar cells or CIGS solar modules) and the emitted light of the solarcell is photographed with a first camera (preferably silicon CCD camera) in order tothereby obtain a first image B1; - at the same CIGS solar cell (or CIGS solar module or anycircuit configuration of CIGS solar cells or CIGS solar modules) the emitted light isphotographed at same positive voltage (or current or lightening) with a second camerawith different spectral sensitivity compared to the first camera (preferably a InGaAscamera or a Si CCD or a camera with a suitable filter) to obtain a second image B2; - it iscalculated a quotient image Q from the both images B1 and B2. - By means of a suitablecalibration, a band gap image (stoichiometry image) is calculated from the quotient imageQ.

申请人：Forschungszentrum Jülich GmbH,Univerza v Ljubljani

代理机构：Gille Hrabal

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