TESTING PROBE AND SEMICONDUCTOR TESTING FIXTURE, A

专利名称：TESTING PROBE AND SEMICONDUCTOR

TESTING FIXTURE, AND FABRICATIONMETHODS THEREOF

发明人：LEI SHI申请号：US14926961申请日：20151029

公开号：US20160124017A1公开日：20160505

专利附图：

摘要：Testing probe and semiconductor testing fixture, and their fabrication methodsare provided. A plurality of first testing pins is formed on the substrate, each first testing

pin including a first testing terminal on a top and a first connection terminal on a bottom.An insulating layer is formed on a sidewall surface of each first testing pin. A number ofsecond testing pins are formed on the insulating layers, each second testing pin includinga second testing terminal on a top thereof and a second connection terminal on abottom thereof. A first concave surface is formed on a top of the second testingterminal, and surrounds a corresponding first testing pin.

申请人：NANTONG FUJITSU MICROELECTRONICS CO., LTD.

地址：NANTONG CN

国籍：CN

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