专利名称:TESTING PROBE AND SEMICONDUCTOR
TESTING FIXTURE, AND FABRICATIONMETHODS THEREOF
发明人:LEI SHI申请号:US14926961申请日:20151029
公开号:US20160124017A1公开日:20160505
专利附图:
摘要:Testing probe and semiconductor testing fixture, and their fabrication methodsare provided. A plurality of first testing pins is formed on the substrate, each first testing
pin including a first testing terminal on a top and a first connection terminal on a bottom.An insulating layer is formed on a sidewall surface of each first testing pin. A number ofsecond testing pins are formed on the insulating layers, each second testing pin includinga second testing terminal on a top thereof and a second connection terminal on abottom thereof. A first concave surface is formed on a top of the second testingterminal, and surrounds a corresponding first testing pin.
申请人:NANTONG FUJITSU MICROELECTRONICS CO., LTD.
地址:NANTONG CN
国籍:CN
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