ELECTRONIC COMPONENT TEST INSTRUMENT

专利名称：ELECTRONIC COMPONENT TEST

INSTRUMENT

发明人：KAZUYUKI YAMASHITA,AKIHIKO ITO申请号：AU2003241973申请日：20030530

公开号：AU2003241973A1公开日：20050121

摘要：An electronic component test instrument for conducting a test by pressing theinput/output terminals (HB) of an IC chip (IC) against a contact section (151) of a testhead (150). The electronic component test instrument has a test plate (110) swingablyholding a test plate body (111). The test plate body (111) comprises a holding section(113) that has a holding surface (114) for holding the back of the IC chip (IC) thereon. Theholding surface (114) is larger than the back and substantially smooth. On the back ofthe IC chip (IC), no input/output terminals (HB) are led out. During test, the IC chip (IC)held by the holding section (113) is pressed against the contact pins of the contactsection while the sides (113b) of the holding section (113) is guided along the guide faces(153) provided around the contact section (151).

申请人：ADVANTEST CORPORATION

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