Electrical device testing fixture

专利名称：Electrical device testing fixture发明人：Kejun Shen申请号：US14905095申请日：20150515公开号：US09927462B2公开日：20180327

专利附图：

摘要：An electrical device testing fixture is disclosed. The electrical device testingfixture includes a stationary base, an electrode holder, a negative electrode and apositive electrode, a stopper holder, and a stopper; the stationary base is provided withtwo through wire mounting holes in which wires are routed; the electrode holder is

provided with two separate long slots; the two electrodes are fixed in the two long slotsrespectively and movable in the slots respectively; an electrical device is connectedbetween the two electrodes; a restoring spring is provided between the stopper and thestopper holder; and the stopper is configured to fix the electrical device. The electricaldevice testing fixture can address the high cost problem due to the requirement ofdifferent testing fixtures corresponding to different models of electrical devices.

申请人：BOE TECHNOLOGY GROUP CO., LTD.,BOE OPTICAL SCIENCE ANDTECHNOLOGY CO., LTD.

地址：Beijing CN,Suzhou, Jiangsu CN

国籍：CN,CN

代理机构：Ladas & Parry LLP

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